{"id":9978,"date":"2022-04-23T11:43:13","date_gmt":"2022-04-23T08:43:13","guid":{"rendered":"https:\/\/www.weebit-nano.com\/?p=9978"},"modified":"2025-06-17T13:50:23","modified_gmt":"2025-06-17T10:50:23","slug":"reram-qualification-embedded-rram","status":"publish","type":"post","link":"https:\/\/www.weebit-nano.com\/reram-qualification-embedded-rram\/","title":{"rendered":"Compressing a Lifetime\u2019s Worth of Stress: <br>ReRAM Qualification Explained"},"content":{"rendered":"<p>In our last post, we talked about the technology transfer process. This article covers what happens after the technology is transferred to a fab, as <a href=\"https:\/\/www.weebit-nano.com\/investors\/guide-to-reram\/\">Weebit ReRAM<\/a> continues on the road toward volume production.<\/p>\n<p><img fetchpriority=\"high\" decoding=\"async\" class=\"alignnone wp-image-9987 size-large\" src=\"https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/motion-road-1024x646.jpg\" alt=\"ReRAM Qualification Explained\" width=\"800\" height=\"505\" srcset=\"https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/motion-road-1024x646.jpg 1024w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/motion-road-300x189.jpg 300w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/motion-road-768x485.jpg 768w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/motion-road-1536x969.jpg 1536w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/motion-road-2048x1292.jpg 2048w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/><\/p>\n<h2>The Basics of Qualification<\/h2>\n<p>If you\u2019ve perused the <a href=\"https:\/\/www.weebit-nano.com\/investors\/glossary\/\">Weebit Glossary<\/a>, you will already know qualification is the process by which a fab ensures a design is ready for mass production, confirming it meets commercial specifications and will continue to do so over the expected lifetime of the product. This includes ensuring that it is stable, operates reliably as designed, and meets yield targets and quality standards.<\/p>\n<p>One of the biggest parts of qualification is failure mode and defect analysis \u2013 determining whether any of the many things that could happen to a product during its lifetime will negatively impact it. In simple words \u2013 what could go wrong with the product? The first step is figuring out what all those possible things may be, and the next step is putting the product through a rigorous set of tests to determine possible failures.<\/p>\n<p>Whatever the product, testing is focused on how long the expected useful life of that product is. A mobile phone might only need to be tested for three years of use, while a car may need to be tested for 15 years of its expected useful lifetime.<\/p>\n<p>So how do you test a product for all of the stress it might experience over many years? The key lies in amplifying the stress level and applying that stress constantly over a compressed timeframe.<\/p>\n<p><strong>In a 2006 commercial, Ikea explained how in one week they test for three years of expected home use:<\/strong><\/p>\n<p><iframe title=\"IKEA product testing commercial\" width=\"800\" height=\"600\" src=\"https:\/\/www.youtube.com\/embed\/kP9PZYjVwUo?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" referrerpolicy=\"strict-origin-when-cross-origin\" allowfullscreen><\/iframe><\/p>\n<p>&nbsp;<\/p>\n<p>Of course, to actually test its products, Ikea uses specially developed machines in sophisticated testing labs, not a nimble, incredibly patient gentleman. But you get the idea.<\/p>\n<h2>Accelerated Stress Testing<\/h2>\n<p>To simulate the effects of environmental factors on a product over its expected lifetime, it\u2019s necessary to devise tests that imitate in an accelerated manner how the product will live its life. Because Non-Volatile Memories (NVMs) have been used in semiconductor products for many years, tests are standardized through <a href=\"https:\/\/www.jedec.org\/\" target=\"_blank\" rel=\"noopener\">industry standards body JEDEC<\/a>. These tests were developed for flash memories which are the main types of NVMs that have been around in one form or another since 1970.<\/p>\n<p>The most important things we need to test are a memory device\u2019s endurance (the number of Program\/Erase cycles it can reliably handle) and its retention (the time period in which data can be reliably stored at a given temperature).<\/p>\n<p>High temperatures can speed up chemical reactions and can negatively impact a product\u2019s lifetime (think spoiled milk). This is true in memories as well, so devices must be tested for endurance and retention under worst-case high temperatures for extended time periods. For example, to ensure a device can maintain data retention for 10 years at 125 degrees Celsius, the equivalent test might subject the device to 200 degrees Celsius constantly for one month.<\/p>\n<p>Devices must also be subjected to thermal shocks, low-temperature programming, and a number of other circumstances. And temperature stress comprises only a fraction of the testing needed for memory device qualification \u2013 other factors such as voltage fluctuations, surface mount technology (SMT), and many others, can impact the performance of the device.<\/p>\n<p><img decoding=\"async\" class=\"alignnone wp-image-9989 size-full\" src=\"https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Accelerated-Stress-Testing.jpg\" alt=\"surface mount technology (SMT)\" width=\"1000\" height=\"667\" srcset=\"https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Accelerated-Stress-Testing.jpg 1000w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Accelerated-Stress-Testing-300x200.jpg 300w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Accelerated-Stress-Testing-768x512.jpg 768w\" sizes=\"(max-width: 1000px) 100vw, 1000px\" \/><\/p>\n<h2>Emerging Technology<\/h2>\n<p>One of the challenges for <a href=\"https:\/\/www.weebit-nano.com\/technology\/overview\/\">ReRAM technology<\/a> is that it is an emerging technology \u2013 and there may be conditions that impact it differently than other NVMs. That said, a lot of the stresses will be the same, so we start with the standard tests that have been developed over the past 50 years. Our team then projects what other possible failure mechanisms might exist and develops specific tests for those. The incredible R&amp;D teams at Weebit and <a href=\"https:\/\/www.leti-cea.com\/cea-tech\/leti\/english\/Pages\/Welcome.aspx\" target=\"_blank\" rel=\"noopener\">CEA-Leti<\/a> are experts at this.<\/p>\n<p>In addition to carrying out the required full qualification tests for our ReRAM, we\u2019re also adding in an initial qualification phase. The results of these initial tests will provide customers with the confidence to start designing their products with our ReRAM while we continue with full qualification testing. Once started, initial qualification tests take up to a few months to complete.<\/p>\n<p>After completion of initial qualification, we\u2019ll proceed with full qualification. During this process, Weebit\u2019s embedded ReRAM module will be subjected to more stress at higher temperatures for longer periods of time. This process will include several lots of devices tested consecutively for anywhere between three and six months \u2013 accounting for the time it takes for the several lots of wafers to be separately manufactured in the fab.<\/p>\n<p>The below industry-standard \u2018bathtub curve\u2019 shows how potential failures would normally be expected to occur in a new product. It\u2019s expected that initial defects could cause failures, but those failures will quickly decrease as the product matures. Likewise, toward the end of a product\u2019s life, you\u2019d again expect to see more failures as the product wears out. In the middle of the curve, failures should be quite limited. The initial qualification phase would be expected to identify any early failures and would be a good time for customer designs, while full qualification covers the rest of a product\u2019s expected lifetime.<\/p>\n<figure id=\"attachment_9992\" aria-describedby=\"caption-attachment-9992\" style=\"width: 903px\" class=\"wp-caption alignnone\"><img decoding=\"async\" class=\"wp-image-9992 size-full\" src=\"https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Emerging-Technology.png\" alt=\"bathtub curve\" width=\"903\" height=\"482\" srcset=\"https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Emerging-Technology.png 903w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Emerging-Technology-300x160.png 300w, https:\/\/www.weebit-nano.com\/wp-content\/uploads\/2022\/04\/Emerging-Technology-768x410.png 768w\" sizes=\"(max-width: 903px) 100vw, 903px\" \/><figcaption id=\"caption-attachment-9992\" class=\"wp-caption-text\">Hypothetical Failure Rate vs. Time<\/figcaption><\/figure>\n<h2>High Expectations<\/h2>\n<p>Qualification is a key part of the semiconductor manufacturing process, and each product must be qualified on every new target process. Right now, Weebit is going through the qualification process of our embedded ReRAM module with Leti, which is expected to wrap up in the second half of the year. In parallel, once the SkyWater silicon is available, we will embark on the qualification of our technology on the SkyWater 130nm process.<\/p>\n<p>While we\u2019re eager to speed through these tests, it\u2019s important to take our time and be rigorous to ensure the final product surpasses quality and performance standards.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>In our last post, we talked about the technology transfer process. This article covers what happens after the technology is transferred to a fab, as Weebit ReRAM continues on the road toward volume production. The Basics of Qualification If you\u2019ve perused the Weebit Glossary, you will already know qualification is the process by which a [&hellip;]<\/p>\n","protected":false},"author":14,"featured_media":9989,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":"","_links_to":"","_links_to_target":""},"categories":[1,63],"tags":[],"class_list":["post-9978","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-general","category-tech-explainer"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.1 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>ReRAM | RRAM Blog by Weebit Nano<\/title>\n<meta name=\"description\" content=\"This article covers what happens after the technology is transferred to a fab, as Weebit ReRAM continues on the road toward volume production\" \/>\n<meta name=\"robots\" content=\"index, follow, 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